Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

TitleComposition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
Publication TypeJournal Article
Year of Publication2018
AuthorsDi Russo, E, Moyon, F, Gogneau, N, Largeau, L, Giraud, E, Carlin, J-F, Grandjean, N, Chauveau, JM, Hugues, M, Blum, I, Lefebvre, W, Vurpillot, F, Blavette, D, Rigutti, L
JournalThe Journal of Physical Chemistry C
Volume122
Issue29
Pagination16704 - 16714
Date PublishedFeb-07-2020
ISSN1932-7447
URLhttp://pubs.acs.org/doi/10.1021/acs.jpcc.8b03223http://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.8b03223
DOI10.1021/acs.jpcc.8b03223
Short TitleJ. Phys. Chem. C
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